Mechanical Shock testing of the devices X-Y axis determines the suitability of the devices for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation.
Shocks of this type may disturb operating characteristics or cause damage similar to that resulting from excessive vibration.
Devices are tested to MIL-STS-202, Method 213B and are typically subjected to three saw tooth pulses with an amplitude of 100 g’s for five to six milliseconds in each axis direction. After testing, the devices are visually and electrically tested after testing to look for failures.





